Reactive Beam Technology (RBT) and Hooghan Consultancy and Services (HCS) have come together to bring you over 25 years of combined FIB experience.
We specialize in the highest quality FIB Services including semiconductor circuit modification / debug and Scanning or Transmission Electron Microscopy (SEM/TEM) sample preparation and analysis. Additionally we can provide training and consulting services for all your FIB applications and operations, to enhance your in- house capabilities.
Our newly renovated Dallas area laboratory is equipped with state of the art equipment including the FEI V600 with a Sidewinder column demonstrating 5 nanometer resolution, and access to a JEOL 2000FX TEM with digital imaging and EDX analysis capability.
RBT/HCS has pioneered various deposition and sample preparation techniques to enhance the receptiveness of the sample to processing and achieve the highest possible quality and clarity of analysis. Our development activities include work with exotic materials, depositions, and enhanced etching processes.
We offer competitive pricing and ensure customer satisfaction. If you need answers, and who doesn’t, call RBT /HCS. Within the Dallas / Fort Worth metroplex we will be happy to come by and pick up your samples and, if desired, to discuss your requirements in person. Call today to discuss how we can help you.
Our strategic partners, provide a wide variety of Microelectronic FA services, complementing what we offer, so our clients can have all their needs fulfilled at one location. Please let us know your requirements and we can go from there.